Thermal Decomposition of Delithiated Dathodes Draws Major Attention Due to its Contribution to the Thermal Runaway of Lithium-Ion Batteries

Boston, MA (PRWEB) August 17, 2012

Dr. Zonghai Chen of Argonne National Laboratory will present on “Thermal Decomposition Pathway of Delithiated Cathodes” at the upcoming Battery Safety 2012 Conference set to take place on December 6-7, 2012 in Las Vegas, NV. Thermal decomposition of delithiated cathodes has drawn major attention due to its contribution to the thermal runaway of lithium-ion batteries. In situ high energy X-ray diffraction was deployed to investigate the mechanism of thermal decomposition of delithiated cathodes. The impact of materials composition as well as electrolytes will be discussed in this talk.

Widely publicized safety incidents and recalls of lithium-ion batteries have raised legitimate concerns regarding lithium-ion battery safety. Battery Safety 2012 is conveniently timed with Lithium Battery Power 2012, and will address these concerns by exploring the following topics:

Application specific battery safety issues affecting battery performance
Major battery degradation and reliability factors
Battery management systems
Commercial cells evaluation and failure analysis
Advances in testing techniques and protocols
High throughput testing, automation and modeling for better safety
Standardization and regulatory issues

Distinguished Speaker Faculty

-Brian J. Landi, PhD, Rochester Institute of Technology

-Zonghai Chen, PhD, Argonne National Laboratory

-Malgorzata (Maggie) Gulbinska, PhD, Yardney Technical Products

-David G. Miller, Naval Surface Warfare Center (NSWC) Crane

-Alvin Wu, Underwriters Laboratories Taiwan Co., Ltd., Underwriters Laboratories

-Sheng S. Zhang, PhD, U.S. Army Research Laboratory

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