(PRWEB) March 20, 2015
SEM examined and qualitatively/quantitatively analyzed 65 implant systems in a new intermediate report titled Surface analysis of sterile-packaged implants by Dr. Dirk Duddeck and Dr. Jorg Neugebauer, PhD, in cooperation with the European Association of Dental implantologists BDIZ-EDI. The report, which was conducted at the University Of Cologne in Germany, ranked MIS as one of the top competitors in a list of implant providers.
As a continuance to previous works (sited in the report), the aim of the study was to verify improvements of manufacturing and quality management as well as to demonstrate the high quality level of the participating manufacturers and implant companies.
65 dental implants from different leading manufacturers underwent topographical and chemical composition analysis by SEM and EDX. Conclusions reached in the study state: THE C1 IMPLANT AND THE SEVEN IMPLANT, (BOTH MIS) STOOD OUT POSITIVELY IN THE CURRENT STUDY.
MIS goes to great lengths to ensure the surface purity of our implants, says Dr. Reiner, and this is the second such independent study published within the past 12 months that verifies our claims. The previous study was published in The POSEIDO Journal 2014 (volume 2).
Dr. Reiner explains the rigorous surface treatment processes applied by MIS that has led to such desirable results. We monitor the surface roughness, uniformity and purity of our implants on a daily basis, taking samples from selected batches, and using our own in-house Scanning Electron Microscope. Because the analysis is done in our own labs, on-site, theres no holding up production for repairs.
MIS adheres to strict procedures, adding any steps necessary to ensure the lowest percentage of contaminants; including blasting residue or remnants from various stages of production, continues Dr. Reiner. Because the SEM analysis is done on samples only, a trained technician also does a 100% visual inspection on each and every implant. Any flawed implants are unconditionally rejected.
Im very pleased with the results of this study; however it doesnt really surprise us, she confides. Maintaining the highest standards in both implant surface topography and chemical composition are of vital importance at MIS. Our aim is to consistently produce implants with an ideal surface roughness; micro and nano porosity, using advanced sand-blasting and acid-etching techniques, and to attain a near flawless surface purity.”
Putting things into perspective, Dr. Reiner concludes, The reason for investing all this time and effort isnt just to look good in research studies. Its to supply our customers, implantology professionals around the world, with the highest quality implants in the market implants that are exceptionally biocompatible and encourage quick reliable integration into bone, for long-term predictable results.
The Surface analysis of sterile-packaged implants study Protocol included the use of a Scanning Electron Microscope (SEM), which enabled the topical evaluation of each implant surface. The high sensitivity backscattered electron detector generates images in compositional and topographical modes to a magnification of X 10,000 for this study. The BSE detector also allows researchers to draw conclusions about the chemical nature and allocation of remnants or contaminants on the sample material. Qualitative and quantitative analyses of implant surfaces were done using Energy Dispersive X-ray Spectroscopy (EDX). This element identification software even allows the identification of elements deep within the sample. Testing on MIS implants revealed percentages of Titanium, Oxygen, Aluminum and Vanadium.
The quoted implant surface studies are available for download from the MIS Website:
Surface Analysis of Sterile-Packaged Implants: EDI Journal, Issue 1/2015: http://www.mis-implants.com/Scientific/Articles.aspx
The POSEIDO Journal 2014 (Volume 2): Identification card and codification of the chemical and morphological characteristics of 62 dental implant surfaces: http://www.mis-implants.com/Scientific/ResearchMaterials.aspx